MPRL Facilities
Transmission Electron Microscopy (TEM)
Several electron microscopes are available to MPRL researchers at Georgia Tech. A Hitachi HF- 2000 field emission TEM provides a resolution of 0.1 nm (lattice) resolution and 0.23 nm (point-to- point) when operated at 200 keV. Accessories include a Noran energy dispersive x-ray spectrometer with detection capabilities down to boron, a Gatan parallel electron energy loss spectrometer for light element analysis, a slow scan CCD camera, an electron holography unit for three-dimensional analysis of crystals, and a double-tilt holder for diffraction studies. This field emission microscopy lab is one of the best facilities available at a U.S. university. Georgia Tech also has a JEOL 4000EX, 400 keV ultrahigh resolution, top entry TEM. Operated with the single crystal LaB6 (lanthanum hexaboride) filament at 400 keV, the lattice resolution is 0.14 nm and the point-to-point resolution is 0.19 nm.